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Effects of CdS Buffer Layers on Photoluminescence Properties of Cu2ZnSnS4 Solar Cells

机译:CdS缓冲层对Cu2ZnSnS4太阳能电池光致发光性能的影响

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摘要

Cu2ZnSnS4 (CZTS) absorber layers grown by sputtering were investigated by photoluminescence before and after the chemical bath deposition of CdS in order to evaluate the possible passivation of point defects by Cd atoms at the absorber/buffer layer interface. According to the literature, a broad emission around 1.21 eV was observed at low temperature under above bandgap excitation of the as-grown CZTS samples. Broad bands at 1.075 eV and 0.85 eV were detected for the first time under below bandgap excitation of the as-grown CZTS samples at low temperature, which were explained in terms of radiative transitions involving point defect-related levels determined in the literature by first-principles calculations. The emissions observed in the as-grown samples were monitored by both above and below bandgap excitations also in standard CZTS solar cells produced on the same layers. The obtained results suggest that, as in the case of Cu(In, Ga)Se-2, Cd atoms passivate point defects at the absorber/buffer layer interface also in CZTS.
机译:在化学浴沉积CdS之前和之后,通过光致发光研究了通过溅射生长的Cu2ZnSnS4(CZTS)吸收剂层,以评估吸收剂/缓冲层界面处Cd原子可能造成的点缺陷钝化。根据文献,在上述CZTS样品的带隙以上激发下,在低温下观察到约1.21 eV的宽发射。在低温下,在生长的CZTS样品的带隙激发以下,首次检测到1.075 eV和0.85 eV的宽带,这是根据涉及到点缺陷相关水平的辐射跃迁解释的。原理计算。同样在同一层上生产的标准CZTS太阳能电池中,通过带隙上方和下方的激发来监测生长样品中的发射。获得的结果表明,与Cu(In,Ga)Se-2的情况一样,CdTS中Cd原子也会在吸收体/缓冲层界面处钝化点缺陷。

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