Simultaneous Measurement of Local Magnetic and Thermal Parameters by Thermal Wave Scanning Microscopy

摘要

To characterize magnetic materials on nanoscales, a new technique has been developed which is based on the combination of two scanning thermal near-field techniques: the thermally modulated ferromagnetic resonance induced by the probe of a scanning thermal wave microscope and the detection of the 3ω signal from the same thermal probe. The simultaneous detection of the thermally modulated microwave absorption and of the 3ω response of the nanoprobe offers a means to control the thermal contact between probe and sample during scans across the sample. In this contribution, the experimental setup is described and results of measurements conducted on Fe-based structures deposited on a MgO substrate are presented.