首页>
外国专利>
Method and apparatus for performing localized thermal analysis and sub-surface imaging by scanning thermal microscopy
Method and apparatus for performing localized thermal analysis and sub-surface imaging by scanning thermal microscopy
展开▼
机译:通过扫描热显微镜进行局部热分析和亚表面成像的方法和装置
展开▼
页面导航
摘要
著录项
相似文献
摘要
A platinum/Rhodium resistance thermal probe is used as an active device which acts both as a highly localized heat source and as a detector to perform localized differential calorimetry, by thermally inducing and detecting events such as glass transitions, meltings, recystallizations and thermal decomposition within volumes of material estimated at a few m3. Furthermore, the probe is used to image variations in thermal conductivity and diffusivity, to perform depth profiling and sub-surface imaging. The maximum depth of the sample that is imaged is controlled by generating and detecting evanescent temperature waves in the sample.
展开▼