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Preparation of boron-silicon thin film by pulsed laser deposition and its properties

机译:脉冲激光沉积制备硼硅薄膜及其性能

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Boron-silicon amorphous films were prepared by pulsed laser deposition technique, Band gap was estimated from the optical absorption spectrum for the films, and it increased with increasing silicon concentration. The values and concentration dependence of the band gap are nearly the same as those measured for amorphous B-Si prepared by electron beam evaporation. Electrical (dc) conductivity of the films was two or three orders of magnitude larger than that of amorphous boron, and its temperature dependence reveals variable-range-hopping-type behavior (Mott's low). Concentration dependence of the de conductivity is similar to that of metal-doped beta -rhombohedral boron, (C) 2000 Academic Press. [References: 14]
机译:通过脉冲激光沉积技术制备了硼硅非晶薄膜,从薄膜的光吸收光谱估计带隙,并随着硅浓度的增加而增加。带隙的值和浓度依赖性与通过电子束蒸发制备的非晶B-Si所测量的值和浓度依赖性几乎相同。薄膜的电(dc)电导率比非晶硼大2或3个数量级,并且其温度依赖性揭示了变程跳跃型行为(Mott值低)。导电性对浓度的依赖性类似于金属掺杂的β-菱形六面体硼,(C)2000 Academic Press。 [参考:14]

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