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Isotopic fractionation during secondary ionisation mass spectrometry: crystallographic orientation effects in magnetite

机译:二次电离质谱法中的同位素分馏:磁铁矿中的晶体取向效应

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Isotopic and elemental fractionaltion occurs as an inevitable and often frustrating factor in SIMS although the potential and demonstrated capabilities of ion probes make the solution of such problems well worth attaining. This paper describes a source so isotopic fractionation which may arise from the crystallographic structure of the sample. This effect, observed in magnetite, is potentially a source of error in acquiring reproducible isotopic ratios during SIMS of magnetite although no similar effect has been observed during several years of measurements on quartz, olivine or carbonates. The measurements were acquired using an Isolab 54 ion probe by rotating the sample about an axis normal to the surface and measuring ~(18)O/~(16)O ratios as a function of angle. The primary ion beam impacts the sample at an angle of 45°so that ration of the sample should bring lattice planes approximately into and out of coincidence with the primary beam. Repeated ~(18)O/~(16)O measurements from magnetite crystals as a function of orientation show maxima in measured ~(18)O/~(16)O values which can be correlated with channelling along lattice planes. The measured ratio has been observed to increase by approximately 7‰ as a function of angle, variations which are very significant compared with isotopic fractionations produced by geological processes. The maxima correlate well with the [1 1 0], [1 0 1] and [0 1 1] lattice vectors of magnetite and are interpreted as channelling of the primary ions along the lattice vectors. Since it is extremely difficult, if not impossible, to determine the crystabllographic orientation of magnetite in thin section, we believe that it is therefore necessary to measure magnetite samples in at least two orientations (separated by an angle that is not equal to the difference between two channelling orientations) against a standard in a known orientation.
机译:同位素和元素分级分离是SIMS中不可避免且经常令人沮丧的因素,尽管离子探针的潜力和已证明的功能使解决此类问题的方法值得实现。本文描述了一种同位素分级分离的来源,该来源可能来自样品的晶体结构。在磁铁矿中观察到的这种效应可能是在磁铁矿SIMS中获取可再现同位素比值时产生错误的来源,尽管在对石英,橄榄石或碳酸盐的数年测量中未观察到类似的效应。使用Isolab 54离子探针通过围绕垂直于表面的轴旋转样品并测量作为角度函数的〜(18)O /〜(16)O比率来获取测量值。初级离子束以45°的角度撞击样品,因此样品的定量应使晶格平面大约与初级束重合。磁铁矿晶体的〜(18)O /〜(16)O重复测量是取向的函数,结果表明〜(18)O /〜(16)O的最大值与沿晶格面的沟道相关。已经观察到,测得的比率随角度增加了约7‰,与地质过程产生的同位素分馏相比,变化非常明显。最大值与磁铁矿的[1 1 0],[1 0 1]和[0 1 1]晶格矢量相关性很好,并被解释为初级离子沿着晶格矢量的通道化。由于要确定薄层磁铁矿的晶状图取向是极其困难的,即使不是不可能,因此我们认为有必要至少在两个取向上测量磁铁矿样品(以不等于两个通道方向)相对于已知方向上的标准。

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