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Isotopic Measurements of U particles by Secondary Ionisation Mass Spectrometry (SIMS)

机译:二次电离质谱(SIMS)对U粒子的同位素测量

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The most common environmental samples taken by IAEA Safeguards inspectors are dust samplesrncollected on cotton swipes. The isotopic analysis of particles from these samples is one of IAEA’srnmain tools to verify the absence of non-declared nuclear material handling and has since it wasrnfirst introduced in the early 1990’s been proven as a reliable and extremely sensitive technique.rnIAEA’s environmental samples are analysed at the Safeguards Analytical Laboratory (SAL)rnand/or by a laboratory in an international network highly specialized in this type of analysis. Thernisotopic analysis of U particles at SAL is done by the use of Secondary Ion Mass Spectrometryrn(SIMS). The analytical SIMS work includes sample preparation, screening methods to locate Urnparticles in a matrix of other material and the final isotopic measurements of individual particles.rnThis paper presents an overview on the status and SAL’s program for analytical improvements inrnthe analysis of U particles by SIMS.
机译:IAEA保障检查员最常见的环境样品是在棉签上收集的灰尘样品。这些样品中颗粒的同位素分析是国际原子能机构用来验证不存在未申报核材料处理的主要工具之一,并且自1990年代初首次引入以来,已被证明是一种可靠且极为敏感的技术。在“保障分析实验室(SAL)”中和/或由高度专注于此类分析的国际网络中的实验室进行分析。通过使用二次离子质谱法(SIMS)对SAL处的U粒子进行同位素分析。 SIMS的分析工作包括样品制备,将Ur颗粒定位在其他材料基质中的筛选方法以及单个颗粒的最终同位素测量结果。本文概述了SIMS分析U颗粒的现状和SAL的分析改进计划。

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