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首页> 外文期刊>International Journal for Numerical Methods in Engineering >Numerical simulation of underfill encapsulation process based on characteristic split method
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Numerical simulation of underfill encapsulation process based on characteristic split method

机译:基于特征分解法的底部填充胶包埋过程的数值模拟

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Electronic packaging protects the integrated circuit chip from environmental and mechanical damages. Underfilling encapsulation is an electronic packaging technology used to reinforce the solder joints between chip and the substrate. For better mould design and optimization of the process, flow analysis during the encapsulation process is the first necessary step. This paper focuses on the study of fluid flow in underfilling encapsulation process as used in electronics industry. A two-dimensional numerical model was developed to simulate the mould filling behaviour in underfilling encapsulation process. The analysis was carried out by writing down the conservation equations for mass, momentum and energy for a two-dimensional flow in an underfilling area. The governing equations are solved using characteristic based split (CBS) method in conjunction with finite element method to get the velocity and pressure fields. The velocity field was used in pseudo-concentration approach to track the flow front. Pseudo-concentration is based on the volume of fluid (VOF) technique and was used to track fluid front for each time step.
机译:电子封装可保护集成电路芯片免受环境和机械损害。底部填充封装是一种电子封装技术,用于增强芯片和基板之间的焊点。为了更好地进行模具设计和优化工艺,在封装过程中进行流量分析是第一步。本文重点研究电子工业中底部填充封装过程中的流体流动。建立了一个二维数值模型,以模拟在底部填充封装过程中的模具填充行为。通过写下在底部填充区域中二维流动的质量,动量和能量的守恒方程进行分析。使用基于特征的分裂(CBS)方法结合有限元方法求解控制方程,以获得速度和压力场。在伪集中方法中使用了速度场来跟踪流动前沿。伪浓度基于流体体积(VOF)技术,用于跟踪每个时间步长的流体前沿。

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