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Switching Diodes Based on GaAs with Deep Impurity Centers

机译:具有深杂质中心的基于GaAs的开关二极管

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The characteristics of switching diodes based on GaAs with deep impurity centers are considered. Structures of semiconductor devices are formed during controlled introduction of impurities with deep acceptor centers into n-GaAs. In the reverse branches of their current-voltage characteristics, structures have a region of a negative differential resistance (NDR) and, being switched from a high-resistance to a high-conductivity state, allow formation of electric pulses with rise times of 40-50 ps and amplitudes of up to 1000 V. Data published earlier and new results are systemized. Methods for manufacturing GaAs structures with deep centers and diodes and their main characteristics are briefly presented. The nature of the formation of NDR in such structures and the switching mechanism in the NDR region during avalanche breakdown are analyzed in detail. Examples of using S diodes in pulse engineering are presented.
机译:考虑了具有深杂质中心的基于GaAs的开关二极管的特性。半导体器件的结构是在将具有深受体中心的杂质受控引入n-GaAs期间形成的。在其电流-电压特性的反向分支中,结构具有负差分电阻(NDR)区域,并且从高电阻状态切换到高电导率状态,可以形成上升时间为40- 50 ps和高达1000 V的幅度。较早发布的数据和新结果进行了系统化。简要介绍了具有深中心和二极管的GaAs结构的制造方法及其主要特性。详细分析了这种结构中NDR的形成性质以及雪崩击穿期间NDR区域中的转换机制。给出了在脉冲工程中使用S二极管的示例。

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