首页> 外文期刊>Applied optics >Recovery of multilayer-coated Zerodur and ULE optics for extreme-ultraviolet lithography by recoating, reactive-ion etching, and wet-chemical processes
【24h】

Recovery of multilayer-coated Zerodur and ULE optics for extreme-ultraviolet lithography by recoating, reactive-ion etching, and wet-chemical processes

机译:通过重涂,反应离子刻蚀和湿化学工艺,回收用于极端紫外光刻的多层镀膜Zerodur和ULE光学器件

获取原文
获取原文并翻译 | 示例
           

摘要

Extreme-ultraviolet lithography requires expensive multilayer-coated Zerodur or ULE optics with extremely tight figure and finish specifications. Therefore it is desirable to develop methods to recover these optics if they are coated with a nonoptimum multilayer films or in the event that the coating deteriorates over time owing to long-term exposure to radiation, corrosion, or surface contamination. We evaluate recoating, reactive-ion etching, and wet-chemical techniques for the recovery of Mo/Si and Mo/Be multilayer films upon Zerodur and ULE test optics. The recoating technique was successfully employed in the recovery of Mo/Si-coated optics but has the drawback of limited applicability. A chlorine-based reactive-ion etch process was successfully used to recover Mo/Si-coated optics, and a particularly large process window was observed when ULE optics were employed; this is an advantageous for large, curved optics. Dilute HCl wet-chemical techniques were developed and successfully demonstrated for the recovery of Mo/Be-coated optics as well as for Mo/Si-coated optics when Mo/Be release layers were employed; however, there are questions about the extendability of the HCl process to large optics and multiple coat and strip cycles. The technique of using carbon barrier layers to protect the optic during removal of Mo/Si in HF:HNO_(3) also showed promise.
机译:极紫外光刻需要昂贵的多层镀膜的Zerodur或ULE光学器件,并且具有极其严格的图形和光洁度规范。因此,需要开发一种方法,以在这些光学器件上涂覆非最佳多层膜或由于长期暴露于辐射,腐蚀或表面污染而使涂层随时间而变质的情况下恢复这些光学器件。我们通过Zerodur和ULE测试光学器件评估了重涂,反应离子刻蚀和湿化学技术,以回收Mo / Si和Mo / Be多层膜。重涂技术已成功地用于Mo / Si涂层光学元件的回收中,但具有适用性有限的缺点。一种基于氯的反应离子刻蚀工艺已成功用于回收涂有Mo / Si的光学元件,当使用ULE光学元件时,观察到了特别大的工艺窗口。这对于大型弯曲光学器件是有利的。开发了稀盐酸湿化学技术,并成功地证明了采用Mo / Be脱模层时,Mo / Be涂层光学器件以及Mo / Si涂层光学器件的回收率。但是,对于HCl工艺可扩展至大型光学器件以及多次涂覆和剥离循环的问题,存在一些疑问。在去除HF:HNO_(3)中的Mo / Si期间使用碳阻挡层保护光学器件的技术也显示出了希望。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号