Grazing incidence small-angle X-ray scattering: an advanced scattering technique for the investigation of nanostructured polymer films

摘要

With grazing incidence small-angle X-ray scattering (GISAXS) the limitations of conventional small-angle X-ray scattering with respect to extremely small sample volumes in the thin-film geometry are overcome. GISAXS turned out to be a powerful advanced scattering technique for the investigation of nanostructured polymer films. Similar to atomic force microscopy (AFM), a large interval of length between molecular and mesoscopic scales is detectable with a surface-sensitive scattering method. While with AFM only surface topographies are accessible, with GISAXS the buried structure is also probed. Because a larger surface area is probed, GISAXS also has a much larger statistical significance compared to AFM. Due to the high demand on collimation, GISAXS experiments are based on synchrotron radiation. nanostructures parallel and perpendicular to the sample surface observable in thin poly(styrene-block-isoprene) diblock copolymer films are presented as an example of the possibilities of GISAXS.