首页> 外文会议>Symposium on Application of Synchrotron Radiation Techniques to Materials Science VI, Apr 16-20, 2001, San Francisco, California >Grazing incidence small-angle x-ray scattering applied to the characterization of nanocomposite thin films
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Grazing incidence small-angle x-ray scattering applied to the characterization of nanocomposite thin films

机译:掠入射小角X射线散射在纳米复合薄膜表征中的应用

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摘要

Grazing incidence small-angle x-ray scattering (GISAXS) allows to investigate precisely the microstructure of nanocornposite thin films containing metal nanocrystals produced using different synthesis techniques. We present results on the size, size distribution, shape, and correlation length of metallic nanoparticles embedded in different matrices fabricated by sequential pulsed laser deposition, magnetron sputtering, and ion-beam sputtering co-deposition. The morphology of the nanoparticles is discussed in terms of the different growth process that takes place in each case.
机译:掠入射小角X射线散射(GISAXS)可以精确地研究包含使用不同合成技术生产的金属纳米晶体的纳米角膜薄膜的微观结构。我们介绍了通过顺序脉冲激光沉积,磁控溅射和离子束溅射共沉积制备的嵌入不同基质中的金属纳米颗粒的尺寸,尺寸分布,形状和相关长度的结果。根据每种情况下发生的不同生长过程,讨论了纳米颗粒的形态。

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