首页> 外国专利> VERTICAL/HORIZONTAL SMALL-ANGLE X-RAY SCATTERING DEVICE AND MEASURING METHOD FOR SMALL-ANGLE X-RAY SCATTERING

VERTICAL/HORIZONTAL SMALL-ANGLE X-RAY SCATTERING DEVICE AND MEASURING METHOD FOR SMALL-ANGLE X-RAY SCATTERING

机译:垂直/水平小角度X射线散射装置及小角度X射线散射的测量方法

摘要

A vertical/horizontal small angle X-ray scattering apparatus, for enabling plural numbers of X-ray diffraction measurements, such as, transmission small angle X-ray diffraction, reflection small angle X-ray diffraction, and in-plane X-ray diffraction, etc., comprises an X-ray generating apparatus 11 for generating X-ray, an optic system 16 for forming the X-ray into a predetermined incident beam of X-ray, a sample holder portion 120 for mounting a sample to be measured thereon, to irradiate the incident beam of X-ray thereupon, a vacuum path 17 for passing through small angle X-ray from the sample, and an X-ray detector 18 for detecting the small angle X-ray passing through the vacuum path, wherein the sample holder portion is fixed on a support base 110, while attaching the X-ray generating apparatus, the optic system, the vacuum path and the X-ray detector on a bench 100, as well, to be rotatable around the sample holder portion, and thereby enabling plural numbers of measurements of small angle X-ray scattering.
机译:垂直/水平小角度X射线散射设备,用于进行多种X射线衍射测量,例如透射小角度X射线衍射,反射小角度X射线衍射和面内X射线衍射等等,包括用于产生X射线的X射线产生设备11,用于将X射线形成为预定的X射线入射束的光学系统16,用于安装要测量的样品的样品保持器部分120。为了照射X射线的入射束,在其上照射有用于使来自样品的小角度X射线通过的真空路径17,和检测通过真空路径的小角度X射线的X射线检测器18,其中样品架部分固定在支撑基座110上,同时将X射线发生装置,光学系统,真空路径和X射线检测器也安装在工作台100上,以能够围绕样品架旋转部分,从而可以进行多个测量小角度X射线散射。

著录项

  • 公开/公告号EP1925932A1

    专利类型

  • 公开/公告日2008-05-28

    原文格式PDF

  • 申请/专利权人 RIGAKU CORPORATION;

    申请/专利号EP20060767830

  • 发明设计人 IWASAKI YOSHIO C/O RIGAKU CORPORATION;

    申请日2006-07-04

  • 分类号G01N23/201;

  • 国家 EP

  • 入库时间 2022-08-21 19:55:55

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