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Attenuated Total Reflection-Fourier transform infrared microspectroscopic mapping for the characterisation of paint cross-sections

机译:衰减全反射-傅立叶变换红外显微图用于表征油漆的横截面

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摘要

Paint cross-sections have been analysed using the attenuated total reflection technique combined with FTIR mapping microspectroscopy in order to characterise the nature of the compounds present and map their localisation in the stratigraphy.The study reveals the possibilities offered by micro-ATR devices for obtaining informations about the organic substances employed in painting techniques and in particular their distribution in the different layers,showing a real improvement over traditional analytical investigations in use for the detection of organic substances.Limitations,such as the contamination of the embedding resin and the typical spectral resolution (20 mu m) are presented and alternative methods were proposed to obtain better results.In particular,the use of an infrared transparent salt (KBr) as embedding material for the cross-sections is evaluated and seems to be very promising.Furthermore,ATR mapping represent a useful non-destructive analytical technique complementary to others molecular and elemental analyses to be performed afterwards such as SEM-EDX.
机译:使用衰减全反射技术结合FTIR映射显微光谱仪分析了油漆的横截面,以表征存在的化合物的性质并在地层中绘制它们的位置图。研究揭示了微型ATR设备提供的获取信息的可能性有关绘画技术中使用的有机物质的信息,尤其是它们在不同层中的分布情况,显示了对用于检测有机物质的传统分析研究的真正改进。限制,例如包埋树脂的污染和典型的光谱分辨率提出了20μm的厚度,并提出了替代方法以获得更好的结果。特别是,评估了将红外透明盐(KBr)用作横截面的嵌入材料,这似乎很有希望。映射表示一种有用的无损分析技术o其他随后要进行的分子和元素分析,例如SEM-EDX。

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