Ion-induced secondary electron emission characteristics of compound oxide materials circuit design of automatic measuring systems for secondary electron emission characteristics of protecting materials

摘要

To evaluate protecting material for ac-Plasma Display, it is one of the most important 'value that Ion-induced secondary electron emission characteristics (γ{sub}i). Automatic measuring system results in repeatable result with stability, and expected to have new knowledge about the protecting materials by the detailed analysis for the obtained results. In the present paper, we aimed to produce the measuring system, which is controlled by the personal computer. We examined the point on mounting, and designed minute current circuit, which consist of I-V conversion circuit and isolation amplifier.