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Buffer layer-less fabrication of a high-mobility transparent oxide semiconductor, La-doped BaSnO3

机译:缓冲层的制造高迁移率透明氧化物半导体,La-掺杂BasnO3

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摘要

La-Doped BaSnO3 (LBSO) is one of the most promising transparent oxide semiconductors because its single crystal exhibits high electron mobility; therefore, it has drawn significant attention in recent years. However, in the LBSO films, it is very hard to obtain high mobility due to threading dislocations, which are caused by the lattice mismatch between the film and the substrate. While previous studies have reported that insertion of buffer layers increases the electron mobilities; this approach leaves much to be desired since it involves a two-step film fabrication process, and the enhanced mobility values are still significantly lower than the single crystal values. Thus, herein, we show that the electron mobility of the LBSO films can be improved without the insertion of any buffer layers if the films are grown under highly oxidative ozone (O-3) atmospheres. The O-3 environment relaxes the LBSO lattice and reduces the formation of the Sn2+ states, which are known to suppress the electron mobility in LBSO. The resultant O-3-LBSO films show improved mobility values up to 115 cm(2) V-1 s(-1), which are among the highest values reported for the LBSO films on SrTiO3 substrates and comparable to those of the LBSO films with buffer layers.
机译:La-Doped BasnO3(LBSO)是最有前途的透明氧化物半导体之一,因为其单晶表现出高电子迁移率;因此,近年来它引起了重大关注。然而,在LBSO薄膜中,由于穿线脱位而非常难以获得高迁移率,这是由膜和基板之间的晶格失配引起的。虽然先前的研究报道,缓冲层的插入增加了电子迁移;这种方法留下了很多需要,因为它涉及两步膜制造过程,并且增强的迁移率值仍然显着低于单晶值。因此,在此,我们表明,如果薄膜在高氧化臭氧(O-3)大气中生长,则可以改善LBSO膜的电子迁移率而不插入任何缓冲层。 O-3环境松弛LBSO格子并减少了SN2 +状态的形成,已知抑制LBSO中的电子迁移率。得到的O-3-LBSO膜显示出高达115cm(2)V-1s(-1)的改善的迁移率值,这些值是SRTIO3基材上的LBSO膜的最高值,并与LBSO薄膜相当用缓冲层。

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