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首页> 外文期刊>Journal of Electronic Testing: Theory and Applications: Theory and Applications >Fault Localization and Testability Approaches for FPGA Fabric Aware Canonic Signed Digit Recoding Implementations
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Fault Localization and Testability Approaches for FPGA Fabric Aware Canonic Signed Digit Recoding Implementations

机译:FPGA结构意识到Canonic签名数字重新编码实现的故障定位和可测试性方法

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摘要

Canonic signed digit (CSD) recoding finds applications in real time VLSI signal processing. In this paper, we have proposed optimized FPGA implementations of CSD recoding techniques starting from a two's complement input and a redundant signed digit (SD) input. The architectures exploit the fast, hardwired fabric resources of the FPGA logic elements to give rise to a circuit realization optimized for speed and area. The underutilized logic elements configuring the original design are further targeted to append suitable fault localization circuitry without any compromise in speed and area. This makes the designs attractive for implementation in an era where reliability issues of semiconductor chips are on the rise owing to extensive miniaturization of physical device dimensions. Primitive instantiation and constrained placement based design approach allow us to conveniently select the logic area for mapping or to detect and bypass any physical FPGA slice coordinates if deemed faulty.
机译:Canonic签名数字(CSD)重新编码在实时查找应用程序VLSI信号处理。 在本文中,我们已经提出了从两个补码输入和冗余签名的数字(SD)输入开始的CSD重新编码技术的优化FPGA实现。 该架构利用FPGA逻辑元件的快速,硬连线结构,从而导致优化速度和区域的电路实现。 配置原始设计的未充分利用的逻辑元件进一步旨在附加合适的故障定位电路,而不会在速度和区域中妥协。 这使得设计具有在半导体芯片的可靠性问题的时代实现的吸引力,因为由于物理设备尺寸的大量小型化,在半导体芯片的可靠性问题上升。 基于原始的实例化和受约束的放置的设计方法允许我们方便地选择逻辑区域进行映射,或者如果被视为错误,则可以检测和绕过任何物理FPGA切片坐标。

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