首页> 外国专利> FAULT LOCALIZATION AND ERROR CORRECTION METHOD FOR SELF-CHECKING BINARY SIGNED-DIGIT ADDER, AND DIGITAL LOGIC CIRCUIT TO PERFORM SAME METHOD

FAULT LOCALIZATION AND ERROR CORRECTION METHOD FOR SELF-CHECKING BINARY SIGNED-DIGIT ADDER, AND DIGITAL LOGIC CIRCUIT TO PERFORM SAME METHOD

机译:自检二进制有符号数字加法器的故障定位和误差校正方法,以及执行相同方法的数字逻辑电路

摘要

The present invention relates to a fault localization and an error correction method for a self-checking binary signed-digit adder, and a digital logic circuit to perform the same method. More specifically, the present invention relates to a fault localization and an error correction method for a self-checking binary signed-digit adder which can detect a stuck-at-fault of a self-checking binary signed-digit adder with low costs and low complexity and can perform self-correction of an error using a self-dual concept, and a digital logic circuit to perform the same method to perform the same method.;COPYRIGHT KIPO 2016
机译:本发明涉及一种用于自校验二进制有符号数字加法器的故障定位和纠错方法,以及执行该方法的数字逻辑电路。更具体地,本发明涉及一种用于自校验二进制有符号数字加法器的故障定位和纠错方法,其能够以低成本和低成本检测自校验二进制有符号数字加法器的故障。复杂性,并且可以使用自对偶概念执行错误的自校正,并且数字逻辑电路可以执行相同的方法来执行相同的方法。; COPYRIGHT KIPO 2016

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