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Development of method for active alignment of multiple time delay and integration detectors in the optically butted focal plane assembly of high-resolution spaceborne imaging systems

机译:高分辨率星形成像系统光对接焦平面组件中多次延迟和集成检测器的主动对准方法的开发

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Time delay and integration (TDI) detectors are preferred image sensors for high-resolution spaceborne imaging systems for cartographic applications as they provide higher sensitivity by integrating charges over multiple TDI stages in push broom mode. Large swath requirements are met using multiple TDI detectors in optical butting configuration in the focal plane assembly (FPA) to form a single image line on the ground. These detectors need to be aligned with subpixel accuracy to avoid motion smear and errors in the image mosaicking process. Alignment of the multiple TDI detectors in the FPA is a challenging task and is accomplished using custom methods and setups. Passive alignment techniques rely on very high-resolution microscopes for achieving desired accuracies. Active method requires TDI detectors to be operated in staring mode, which is architecturally and functionally not supported by TDI detectors. We developed a scheme for operating the TDI detectors in staring mode without any smear effects to aid in the active alignment process. Based on this, we propose an active alignment approach. The proposed approach is highly advantageous as it can be used throughout the imaging system development phase to demonstrate stability of the alignment and also helps in cross validation with the passive alignment. The developed method was test validated on qualification model FPA, and alignment accuracy of the order of 0.4 mu m in tilt and 1.2 mu m in line shift has been demonstrated, against the requirements of +/- 1.5 mu m. This method has been extensively used in Cartosat-25 series imaging systems and will be very useful for upcoming high-resolution missions of the Indian Space Research Organisation. (C) 2018 Society of Photo-Optical Instrumentation Engineers (SPIE)
机译:时间延迟和集成(TDI)检测器是用于加州换图应用的高分辨率星载成像系统的优选图像传感器,因为它们通过在推扫帚模式下通过多个TDI级的电荷积分电荷来提供更高的灵敏度。使用焦平面组件(FPA)中的光学探测器中的多个TDI检测器满足大的SWATH要求,以在地面形成单个图像线。这些探测器需要以子像素精度对齐,以避免图像拼接过程中的运动涂抹和错误。 FPA中的多个TDI检测器的对齐是一个具有挑战性的任务,并且使用自定义方法和设置完成。被动对准技术依赖于非常高分辨率的显微镜来实现所需的精度。主动方法需要在凝视模式下操作TDI探测器,其在架构和功能上不受TDI检测器支持。我们开发了一种用于在凝视模式下操作TDI探测器的方案而没有任何涂抹效果,以帮助有效对准过程。基于此,我们提出了一种积极的对准方法。所提出的方法是非常有利的,因为它可以在整个成像系统开发阶段中使用,以证明对准的稳定性,并且还有助于通过被动对准的交叉验证。开发方法在验证型号FPA上验证了测试,并且已经证明了倾斜倾斜0.4μm的对准精度,而换行换档的1.2μm。这种方法已广泛用于Cartosat-25系列成像系统,对于即将到来的印度空间研究组织的高分辨率任务非常有用。 (c)2018年光学仪表工程师协会(SPIE)

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