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Structural characteristics and texture during the microwave freeze drying process of Chinese yam chips

机译:中国山药芯片微波炉冷冻干燥过程中的结构特性和质地

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摘要

Fresh Chinese yam is difficult to store and easily deteriorates during storage, and dehydrated yam chips processed by different methods are widely consumed as a kind of snack food. Freeze drying (FD) is often used to produce high-quality yam chips, but the extralong drying time limits its industrial application. Microwave freeze drying (MFD) has the potential to replace the conventional FD method. Therefore, this research used MFD to dry Chinese yam chips. In this study, the brittleness and hardness of Chinese yam chips during the MFD process were investigated. It was found that the brittleness of Chinese yam chips had a close relationship with the moisture content. The hardness of Chinese yam chips mainly depended on the porosity and moisture content. Moreover, the DoseResp model of the brittleness could effectively predict the brittleness change during the MFD process. The regression equation based on the porosity and moisture content could accurately describe the hardness of the Chinese yam chips during the MFD process.
机译:新鲜的中国山药难以在储存期间储存和容易地恶化,并通过不同方法处理的脱水山药芯片被广泛消耗作为一种零食食品。冷冻干燥(FD)通常用于生产高质量的纱线芯片,但是电路干燥时间限制其工业应用。微波冷冻干燥(MFD)具有替代常规FD方法。因此,这项研究用MFD来干燥中国山药芯片。在这项研究中,研究了MFD过程中山药芯片的脆性和硬度。结果发现,中国山药芯片的脆性与水分含量密切相关。中国山药芯片的硬度主要取决于孔隙率和水分含量。此外,脆性的Doseresp模型可以有效地预测MFD过程中的脆性变化。基于孔隙率和水分含量的回归方程可以在MFD过程中准确地描述中国山药芯片的硬度。

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