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Intrinsic carrier mobility of monolayer GeS and GeSe: First-principles calculation

机译:单层GES和GESE的固有载体流动:第一原理计算

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摘要

Recently, novel two-dimensional (2D) semiconductors of GeS and GeSe have attracted attention due to their potential applications in future nanoelectronic devices. The carrier mobility is first calculated from deformation potential theory (DPT) based on longitudinal acoustic and optical phonon model. Three important parameters of effective mass, elastic modulus and deformation potential are analyzed. Then, the intrinsic mobility is calculated from EPC matrix element. If the polarization effect of semiconductor is considered in the calculation, the electron mobility of GeS (GeSe) is reduced to 4.07 x 10(1) cm(2)V(-1)s(-1) (1.48 x 10(2) cm(2) V-1 s(-1)) for x direction, and 1.94 x 10(1) cm(2)V(-)(1)s(-1 )(7.55 x 10(1) cm(2)V(-1)s(-1)) for y direction. The hole mobility is 4.77 x 10(1)cm(2)V(-1)s(-1) (2.47 x 10(2 )cm(2)V(-)(1)s(-1)) for x direction, and 1.52 x 10(1)cm(2)V(-1)s(-1) (1.16 x 10(2) cm(2)V(-1)s(-1)) for y direction. It is found that longitudinal optical phonon scattering plays a decisive role in carrier mobility. In this study, we illustrate that DPT model from the longitudinal acoustic and optical phonon scattering will overestimate carrier mobility. Some factors that affect carrier mobility are revealed.
机译:最近,由于其未来纳米电子器件的潜在应用,GES和GESE的新型二维(2D)半导体引起了注意力。首先根据纵向声学和光学声子模型从变形电位理论(DPT)计算载流子迁移率。分析了有效质量,弹性模量和变形电位的三个重要参数。然后,从EPC矩阵元素计算内在移动性。如果在计算中考虑半导体的偏振效果,则GES(GESE)的电子迁移率降低至4.07×10(1)厘米(2)V(2)V(-1)(1.48×10(2) X方向Cm(2)V-1 S(-1)),1.94×10(1)厘米(2)厘米(2)V( - )(1)S(-1)(7.55×10(1)厘米(2 )y方向的V(-1)S(-1))。空穴迁移率为4.77×10(1)厘米(2)V(-1)S(-1)(2.47×10(2)cm(2)V( - )(1)S(-1)),用于x方向,1.52×10(1)厘米(2)厘米(2)厘米(-1)(-1)(1.16×10(2)cm(2)V(2)V(-1)S(-1)),用于Y方向。结果发现,纵向光学声子散射在载流子迁移率中起着决定性作用。在本研究中,我们说明了来自纵向声学和光学声子散射的DPT模型将高估载流子迁移率。揭示了影响载流动性的一些因素。

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