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A Porous Silicon P-Type Interdigitated Extended-Gate Field Effect Transistor pH Sensor

机译:多孔硅P型互连的延伸栅极场效应晶体管pH传感器

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We report on a porous silicon (PSi) p-type interdigitated extended-gate field effect transistor (IEGFET) pH sensor. Two types of crystalline orientation substrates were utilized, namely, p-type and p-type . PSi was prepared by an electrochemical etching method with an etching current density of 20 mA/cm(2) and an etching time of 20 min. The scanning electron microscopy investigation revealed that the pore sizes of the p-type were smaller and deeper than those of the p-type for the same etching conditions. The average pore sizes of the p-type ranged from 0.2 to 1 mu m with a depth of 19 mu m. The p-type pore size and depth were found to be 1 to 4.5 mu m and 14 mu m, respectively. The proposed devices were tested in real time in a pH range of 3 to 11 at room temperature. The PSi p-type pH sensor exhibited enhanced pH sensitivity and linearity compared to the PSi p-type sensor. The voltage and current sensitivities of the p-type sensor were found to be approximately 43.75 mV/pH and 104 mu A/pH, respectively. The PSi p-type exhibited comparatively weak voltage and current sensitivities of 7.5 mV/pH and 27.5 mu A/pH, respectively. The performance enhancement of the PSi p-type sensor was due to a higher surface area to volume ratio. The crystal orientation steered the etching direction. The study produced all solid-state semiconductor efficient PSi p-type IEGFET pH sensors without the need for a bulky, fragile and liquid filled reference electrode.
机译:我们报告了多孔硅(PSI)P型交叉延伸栅极场效应晶体管(IEGFET)pH传感器。使用两种类型的结晶取向底物,即p型和p型。通过电化学蚀刻方法制备PSI,蚀刻电流密度为20mA / cm(2)和20分钟的蚀刻时间。扫描电子显微镜调查显示,对于相同蚀刻条件,P型孔径较小,更深于p型。 P型的平均孔径范围为0.2至1μm,深度为19μm。发现p型孔径和深度分别为1至4.5μm和14μm。在室温下,在3至11的pH范围内实时测试所提出的装置。与PSI P型传感器相比,PSI p型pH传感器表现出增强的pH灵敏度和线性。发现p型传感器的电压和电流敏感性分别为约43.75mV / pH和104μA/ pH。 PSI P型分别表现出7.5mV / pH和27.5μmS/ pH的相对弱电压和电流敏感性。 PSI P型传感器的性能增强由于高度的体积比较高。晶体取向导向蚀刻方向。该研究制备了所有固态半导体高效PSI P型IGFET pH传感器,无需庞大,易碎和液体填充的参比电极。

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