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High-power nano- and picosecond optoelectronic switches based on high-voltage silicon structures with p-n junctions: I. Physics of the switching process

机译:基于高压硅结构的高功率纳米和皮秒光电开关,具有P-N结:I.用于切换过程的物理

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摘要

The switching of high-voltage silicon photodiodes, phototransistors, and photothyristors exposed to picosecond laser pulses quasi-homogeneous over illumination area is numerically simulated for the first time. An analysis of the results makes it possible to obtain "empirical" relations between the main switch parameters (energy of control pulses, light absorbance, and structure area) and the parameters characterizing the switching transition process in a circuit with resistive load. For some of these relations, approximate analytical formulas well describing the simulation results are derived. It is noted that the differences between switching processes in three types of structures appears only at long pulses at the final stage, when the blocking capability of photodiodes and phototransistors is recovered.
机译:在数值第一次模拟暴露于Picosecond激光脉冲的高压硅光电二极管,光电晶体管和PhotoThyristors的电解于PicoSecond激光脉冲。 结果分析使得可以获得主开关参数(控制脉冲的能量,光吸收和结构区域)之间的“经验”关系以及表征具有电阻负载的电路中的开关转换过程的参数。 对于这些关系中的一些,推导了描述模拟结果的近似分析公式。 应注意,当恢复光电二极管和光电晶体的阻塞能力时,三种类型的结构中的开关过程之间的差异仅在最终阶段的长脉冲处出现。

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  • 来源
    《Semiconductors》 |2017年第9期|共6页
  • 作者

    Kyuregyan A. S.;

  • 作者单位

    Fed State Unitary Enterprise All Russian Electrot Ul Krasnokazarmennaya 12 Moscow 111250 Russia;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 半导体物理学;
  • 关键词

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