...
首页> 外文期刊>Semiconductors >Investigation into the Internal Electric-Field Strength in the Active Region of InGaN/GaN-Based LED Structures with Various Numbers of Quantum Wells by Electrotransmission Spectroscopy
【24h】

Investigation into the Internal Electric-Field Strength in the Active Region of InGaN/GaN-Based LED Structures with Various Numbers of Quantum Wells by Electrotransmission Spectroscopy

机译:通过电流扫描光谱对InGaN / GaN基LED结构有源区中的内部电场强度的研究

获取原文
获取原文并翻译 | 示例
           

摘要

The internal electric fields of InGaN/GaN-based green-emission LED heterostructures with various numbers of quantum wells in the active region are investigated by electrotransmission spectroscopy. The frequencies of the observed spectral lines are attributed to possible types of interband transitions. An increase in the number of interband transitions of the "quantum well-quantum barrier" type with an increase in the number of quantum wells is found. This is explained by the nonidentical degree of segregation of In atoms in different GaN barriers layers. The strength of internal electric fields in quantum wells is calculated for various values of the bias of the p-n junction using a series of electrotransmission spectra. It is found that the strength of the internal piezoelectric field decreases from 3.20 to 2.82 MV/cm with an increase in the number of quantum wells.
机译:通过电扫描光谱研究具有各种数量的量子孔的IngaN / GaN的绿色发射LED异质结构的内部电场。 观察到的光谱线的频率归因于可能类型的基带转换。 找到随着量子阱数量的增加的“量子阱 - 量子屏障”型的间带式转换的数量增加。 这是通过不同GaN屏障层中原子的非识别偏析的非识别程度来解释。 使用一系列电路探光谱法计算量子阱中的内部电场的强度。 发现内部压电场的强度从3.20到2.82 mV / cm降低,随着量子阱的数量增加。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号