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Synthesis of Monolayer MoS2 Films and Tuning Its Photoelectric Properties via Interface Engineering

机译:通过界面工程合成单层MOS2薄膜并调谐其光电性能

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摘要

Two-dimensional (2D) materials have received considerable attention for their applications in next-generation optoelectronics but are limited by the synthesis of large-area films and the challenges in device optimization. In this study, a uniform MoS2 monolayer film was synthesized by a simple chemical vapor deposition (CVD) method. Phototransistors based on the resulting MoS2 films were fabricated and their photoelectric properties were compared with that of a device with synthesized triangular MoS2 sheets. The results show that the photoresponsivity of the film-based phototransistor is 1180 mA/W at a power density of 1 mW/cm(2), far exceeding (15 times) that of the sheet-based phototransistor. Furthermore, with mild vacuum annealing, the photoresponsivity and photoresponse speed in the film-based phototransistor demonstrated a simultaneous increase, in which the photoresponsivity reached up to 105 A/W with a decreased photoresponse/recovery time from 9 s/22 s to 5 s/8 s under illumination. This satisfactory improvement after vacuum annealing can be attributed to the removal of oxygen atoms from sulfur vacancies and a reduced inherent van der Waals gap at the MoS2/Au interface, which facilitates the trapping of photogenerated electrons and promotes carrier separation. Our work provides a promising strategy for high-performance 2D photodetectors via rational synthesis and interface engineering.
机译:二维(2D)材料对其在下一代光电子中的应用得到了相当大的关注,而是受到大面积膜的合成的限制以及器件优化中的挑战。在该研究中,通过简单的化学气相沉积(CVD)方法合成均匀的MOS2单层膜。制造基于所得MOS2薄膜的光电晶体管,并将其光电性能与合成三角形MOS2片材的装置进行比较。结果表明,基于薄膜的光电晶体管的光反对子是1180mA / W以1mW / cm(2)的功率密度,远超过薄片的光电晶体管的电力密度。此外,通过温和的真空退火,基于膜的光电晶体管中的光响应和光响应速度证明了同时增加,其中光响应率高达105A / W,从9 s / 22 s到5 s的光响应/恢复时间降低/ 8 s在照明下。真空退火后的这种令人满意的改善可以归因于从硫空位中除去氧原子,并且在MOS2 / Au界面处降低的固有范德瓦尔隙,这有利于光生电子捕获并促进载体分离。我们的工作通过合理的合成和接口工程提供了高性能2D光电探测器的有希望的策略。

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