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In Situ Atom Probe Deintercalation of Lithium-Manganese-Oxide

机译:锂 - 锰氧化物的原位原子探针脱嵌

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摘要

Atom probe tomography is routinely used for the characterization of materials microstructures, usually assuming that the microstructure is unaltered by the analysis. When analyzing ionic conductors, however, gradients in the chemical potential and the electric field penetrating dielectric atom probe specimens can cause significant ionic mobility. Although ionic mobility is undesirable when aiming for materials characterization, it offers a strategy to manipulate materials directly in situ in the atom probe. Here, we present experimental results on the analysis of the ionic conductor lithium-manganese-oxide with different atom probe techniques. We demonstrate that, at a temperature of 30 K, characterization of the materials microstructure is possible without measurable Li mobility. Also, we show that at 298 K the material can be deintercalated, in situ in the atom probe, without changing the manganese-oxide host structure. Combining in situ atom probe deintercalation and subsequent conventional characterization, we demonstrate a new methodological approach to study ionic conductors even in early stages of deintercalation.
机译:原子探测断层扫描经常用于材料微观结构的表征,通常假设通过分析不置换微观结构。然而,当分析离子导体时,化学电位的梯度和渗透介电原子原子探针样本的梯度会导致显着的离子迁移率。尽管在瞄准材料表征时,离子迁移率是不希望的,但它提供了一种在原子探针中直接操纵材料的策略。在这里,我们对具有不同原子探针技术的离子导体锂 - 氧化物的分析存在实验结果。我们证明,在30 k的温度下,在没有可测量的锂迁移率的情况下,可以进行材料微观结构的表征。此外,我们表明,在298k时,材料可以在原子探针中原位蜕膜,而不改变氧化锰宿主结构。结合原位原子探针脱嵌和随后的常规表征,我们展示了即使在脱际的早期阶段也研究了离子导线的新方法方法。

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