Atom Probe Field-Ion Microscopy Research on Silicon Carbide Whiskers and Evaluate the Position Sensitive Atom Probe: Foreign Trip Report, September 28, 1988-October 9, 1988.

摘要

Silicon carbide whiskers were successfully analyzed with the pulsed laser atom probe. The position sensitive atom probe at Oxford University was evaluated. Fruitful discussions were held with members of the International Group on Irradiation Damage Mechanisms in Pressure Vessel Steels.