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Conductivity and temperature coefficient of resistance of multilayered polycrystalline films

机译:多层多晶膜的电导率和电阻温度系数

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摘要

We calculate the electric conductivity and the temperature coefficient of resistance (TCR) of a multilayered film consisting of the alternating polycrystalline metal layers of different thickness and purity within the relaxation time formalism. In the case of Cr, Cu and Co-based multilayered films we perform verification of our analytical formulas and demonstrate a qualitative agreement between the theoretically calculated values of the TCR and experiment. (c) 2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
机译:我们计算了在松弛时间形式内由不同厚度和纯度的交替多晶金属层组成的多层膜的电导率和电阻温度系数(TCR)。对于基于Cr,Cu和Co的多层薄膜,我们对我们的分析公式进行了验证,并证明了TCR的理论计算值与实验之间的定性一致性。 (c)2006威尼海姆威利威世私人有限公司。

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