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Photoluminescence Enhancement and Structure Repairing of Monolayer MoSe2 by Hydrohalic Acid Treatment

机译:氢卤酸处理增强单层MoSe2的光致发光和结构修复

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摘要

Atomically thin two-dimensional transition metal dichalcogenides (TMDCs) have attracted much attention recently due to their unique electronic and optical properties for future optoelectronic devices. The chemical vapor deposition (CVD) method is able to generate TMDCs layers with a scalable size and a controllable thickness. However, the TMDC monolayers grown by CVD may incorporate structural defects, and it is fundamentally important to understand the relation between photoluminescence and structural defects. In this report, point defects (Se vacancies) and oxidized Se defects in CVD-grown MoSe2 monolayers are identified by transmission electron microscopy and X-ray photoelectron spectroscopy. These defects can significantly trap free charge carriers and localize excitons, leading to the smearing of free band-to-band exciton emission. Here, we report that the simple hydrohalic acid treatment (such as HBr) is able to efficiently suppress the trap state emission and promote the neutral exciton and trion emission in defective MoSe2 monolayers through the p-doping process, where the overall photoluminescence intensity at room temperature can be enhanced by a factor of 30. We show that HBr treatment is able to activate distinctive trion and free exciton emissions even from highly defective MoSe2 layers. Our results suggest that the HBr treatment not only reduces the n-doping in MoSe2 but also reduces the structural defects. The results provide further insights of the control and tailoring the exciton emission from CVD-grown monolayer TMDCs.
机译:原子薄的二维过渡金属二硫化碳(TMDC)由于其对于未来光电器件的独特电子和光学特性,最近引起了广泛关注。化学气相沉积(CVD)方法能够生成具有可缩放尺寸和可控制厚度的TMDC层。然而,通过CVD生长的TMDC单层可能包含结构缺陷,因此了解光致发光与结构缺陷之间的关系从根本上来说很重要。在此报告中,通过透射电子显微镜和X射线光电子能谱鉴定了CVD生长的MoSe2单层中的点缺陷(硒空位)和氧化的硒缺陷。这些缺陷会极大地俘获自由电荷载流子并使激子局部化,从而导致自由带间激子发射的拖尾。在这里,我们报告说,简单的氢卤酸处理(例如HBr)能够通过p掺杂工艺有效地抑制有缺陷的MoSe2单层中的陷阱态发射并促进中性激子和三重子发射,此时整个房间的光致发光强度温度可以提高30倍。我们证明,即使来自高度缺陷的MoSe2层,HBr处理也能够激活独特的tri光和自由激子发射。我们的结果表明,HBr处理不仅减少了MoSe2中的n掺杂,而且减少了结构缺陷。结果为控制和定制CVD生长的单层TMDC的激子发射提供了进一步的见解。

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