首页> 外文期刊>Instruments and Experimental Techniques >A Secondary Ion Energy Analyzer for Measuring the Degree of Compensation of the Ion Beam Space Charge
【24h】

A Secondary Ion Energy Analyzer for Measuring the Degree of Compensation of the Ion Beam Space Charge

机译:用于测量离子束空间充电补偿程度的二次离子能量分析仪

获取原文
获取原文并翻译 | 示例
           

摘要

This paper describes an analyzer of the energy of secondary slow ions, which is used to measure the degree of compensation of the spatial charge of a hydrogen ion beam in a low energy beam transport channel (LEBT) to the input of an accelerator with high-frequency quadrupole focusing. The electrostatic analyzer with a retarding field has increased accuracy due to the use of a double analyzing grid. The results of measuring the degree of compensation of the space charge of a hydrogen ion beam with a pulse current of 60 mA and an energy of 400 keV are presented. The analyzer also allows non-disturbing measurements of the radial size of the ion beam.
机译:本文描述了二次慢离子能量的分析仪,用于测量氢离子束在低能量束传送通道(LEBT)中的空间电荷的补偿程度,以高 - 频率四极焦聚焦。 由于使用双分析网格,具有延迟场的静电分析仪具有提高的精度。 呈现了测量氢离子束的空间电荷补偿程度的结果,脉冲电流为60mA和400keV的能量。 分析器还允许离子束的径向尺寸的不干扰测量。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号