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首页> 外文期刊>CrystEngComm >Fabrication of silicon-vacancy color centers in diamond films: tetramethylsilane as a new dopant source
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Fabrication of silicon-vacancy color centers in diamond films: tetramethylsilane as a new dopant source

机译:在金刚石薄膜中制造硅空位色情:四甲基硅烷作为新的掺杂剂来源

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摘要

Color centers in diamonds hold great promise for applications in optical sensors, bio-imaging, and quantum communication. Here, we synthesize Si-doped diamond films with Si-vacancy (SiV) centers by the flow of tetramethylsilane (TMS, Si(CH3)(4)) gas using the microwave plasma chemical vapor deposition technique. In order to achieve high emission efficiency of the SiV centers, the effect of the TMS content on the microstructural evolution and photoluminescence (PL) of this type of color center is investigated using various spectroscopic techniques and high resolution transmission electron microscopy (HRTEM). The introduction of TMS gas in the diamond films leads to grain refinement of the diamond crystals and a weak SiV PL intensity located at 738 nm, at a growth temperature of 650 degrees C. For diamond films grown at 870 degrees C, the addition of Si atoms results in grain refinement and the transition of the diamond grains from micro-size without doping (no TMS) to nano-level at a Si/C ratio of 1/100. The SiV PL intensity exhibits a non-monotonic behavior with increasing Si/C ratios. At a Si/C ratio of 1/3100, the diamond film features a structure of nano-grains separated with (100) micro-grains, and displays a maximum in the PL intensity of the SiV centers: a very strong narrow peak at 738 nm with a FWHM of about 5.1 nm. Increasing the Si/C ratio promotes the formation of a nanocrystalline structure and the decrease of the SiV PL intensity. The combination of Raman spectral and HRTEM analysis implies that the PL quenching of the SiV center with the increasing Si/C ratios is attributed to the formation of amorphous carbon. Our results not only demonstrate that the diamond film, featuring a structure of nano-crystals with (100) micro-crystals, could be a promising material with high-efficiency SiV centers, but also highlight that this approach to balancing the concentration of Si impurities and the crystalline quality of the diamond films could advance the fabrication of high-emission SiV centers for optical applications.
机译:钻石中的颜色中心对光学传感器,生物成像和量子通信中的应用具有很大的承诺。这里,通过使用微波等离子体化学气相沉积技术通过四甲基硅烷(TMS,Si(4))气体流动,将Si掺杂的金刚石薄膜用Si-resmancy(SiV)中心合成。为了实现SIV中心的高发射效率,使用各种光谱技术和高分辨率透射电子显微镜(HRTEM)研究了TMS含量对这种色调的微观结构演化和光致发光(PL)的影响。在金刚石薄膜中引入TMS气体导致金刚石晶体的晶粒细化和位于738nm的弱SiV Pl强度,在650℃的生长温度下,对于870℃而生长的金刚石膜,添加Si原子导致晶粒细化和金刚石颗粒从微尺寸的过渡,在没有掺杂(没有TMS)至纳米水平的Si / C比为1/100。 SIV Pl强度表现出与增加的Si / C比率的非单调行为。在Si / C比为1/3100的比例,金刚石薄膜具有与(100)微粒分离的纳米颗粒的结构,并在SIV中心的PL强度下显示最大值:738处非常强大的窄峰nm,fwhm约为5.1nm。增加Si / C比促进形成纳米晶体结构的形成和SIV PL强度的降低。拉曼光谱和HRTEM分析的组合意味着SIV中心与增加的Si / C比率的PL猝灭归因于非晶碳的形成。我们的结果不仅证明了具有(100)微晶的纳米晶体结构的金刚石薄膜可以是具有高效SIV中心的有希望的材料,但也强调了这种平衡Si杂质浓度的方法钻石薄膜的晶体质量可以推进用于光学应用的高发射SIV中心的制造。

著录项

  • 来源
    《CrystEngComm》 |2018年第8期|共10页
  • 作者单位

    Chinese Acad Sci IMR Shenyang Natl Lab Mat Sci 72 Wenhua Rd Shenyang 110016 Liaoning Peoples R China;

    Chinese Acad Sci IMR Shenyang Natl Lab Mat Sci 72 Wenhua Rd Shenyang 110016 Liaoning Peoples R China;

    Shenyang Mil Reg Architectural Design Inst South Eleventh Rd Shenyang 110000 Liaoning Peoples R China;

    Chinese Acad Sci IMR Shenyang Natl Lab Mat Sci 72 Wenhua Rd Shenyang 110016 Liaoning Peoples R China;

    Chinese Acad Sci IMR Shenyang Natl Lab Mat Sci 72 Wenhua Rd Shenyang 110016 Liaoning Peoples R China;

    Chinese Acad Sci IMR Shenyang Natl Lab Mat Sci 72 Wenhua Rd Shenyang 110016 Liaoning Peoples R China;

    Chinese Acad Sci IMR Shenyang Natl Lab Mat Sci 72 Wenhua Rd Shenyang 110016 Liaoning Peoples R China;

    Chinese Acad Sci IMR Shenyang Natl Lab Mat Sci 72 Wenhua Rd Shenyang 110016 Liaoning Peoples R China;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 化学工业;晶体学;
  • 关键词

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