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Analysis of improving the edge quality and growth rate of single-crystal diamond growth using a substrate holder

机译:使用基板支架改善单晶金刚石生长的边缘质量和生长速率的分析

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摘要

During single-crystal diamond growth by microwave plasma chemical vapor deposition (MPCVD), polycrystalline diamonds are prone to growing at the edge regions. This substantially reduces the usable area of the grown diamond. In recent years, a series of experimental studies have been carried out to solve this, and some achievements have been obtained. However, to understand the diamond growth mechanism more deeply, the relationship between growth quality and various influencing factors still needs to be studied quantitatively through simulations. The plasma density and substrate temperature are important factors that affect the quality of diamond crystallization. In this paper, the growth conditions of the diamond were simulated and compared with the experiments. The results showed that the temperature distribution on the substrate surface was uniform in the axial direction, while the CH3, H, and electron number density decreased significantly at the edge regions. When the substrate holder mentioned in the literature was used for growth, it was found that the number density uniformity of CH3, H, and electrons on the substrate surface improved significantly, without changing the temperature uniformity, and so did the edge quality of the grown diamond. However, the average growth rate decreased significantly and, combined with the approximate growth rate formula, it was found that the number density of CH3 and H on the substrate surface decreased significantly. The main reason for this was that the substrate holder was too high, which led to the substrate reaching the growth temperature at lower deposition conditions. Therefore, a substrate holder with a 6 mm height reduction was designed for simulation and experiment. The edge quality of the grown diamond with this substrate holder was better than that found using the previous substrate holder, and the growth rate was significantly improved. However, there was still a gap in the growth rate compared with results without the substrate holder. Finally, a substrate ring was proposed, to achieve the goal of high quality and high growth rate at the same time.
机译:通过微波等离子体化学气相沉积(MPCVD)在单晶金刚石生长期间,多晶金刚石在边缘区域易于生长。这基本上减少了生长的金刚石的可用面积。近年来,已经开展了一系列实验研究来解决这一点,已经获得了一些成就。然而,为了更深入地了解钻石生长机制,通过模拟量化仍然需要定量研究生长质量与各种影响因素之间的关系。等离子体密度和衬底温度是影响金刚石结晶质量的重要因素。在本文中,模拟了钻石的生长条件并与实验进行了比较。结果表明,在轴向上,基板表面上的温度分布在轴向方向上均匀,而在边缘区域的CH3,H和电子数密度显着降低。当文献中提到的衬底保持器用于生长时,发现CH3,H和基板上的电子的数密度均匀性显着提高,而不改变温度均匀性,并且生长的边缘质量也是如此钻石。然而,平均生长速率显着下降,并与近似的生长速率配方结合,发现基板表面上的CH3和H的数量密度显着降低。主要原因是衬底支架太高,导致基板在较低沉积条件下达到生长温度。因此,设计了具有6mm高度的基板支架,用于模拟和实验。具有该基板支架的生长金刚石的边缘质量比使用先前的基板保持器更好,并且生长速率显着提高。然而,与没有基板夹持器的结果相比,生长速率仍然存在间隙。最后,提出了一种基板环,同时实现高质量和高生长速率的目标。

著录项

  • 来源
    《CrystEngComm》 |2019年第43期|共11页
  • 作者单位

    Huazhong Univ Sci &

    Technol Sch Mech Sci &

    Engn Wuhan 430074 Hubei Peoples R China;

    TrueOne Semicond Technol Co Ltd Guangzhou 528251 Guangdong Peoples R China;

    Huazhong Univ Sci &

    Technol Sch Mech Sci &

    Engn Wuhan 430074 Hubei Peoples R China;

    Huazhong Univ Sci &

    Technol Sch Mech Sci &

    Engn Wuhan 430074 Hubei Peoples R China;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 化学工业;晶体学;
  • 关键词

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