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首页> 外文期刊>Acta odontologica Scandinavica. >Back-scattered and secondary electron images of scanning electron microscopy in dentistry: A new method for surface analysis
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Back-scattered and secondary electron images of scanning electron microscopy in dentistry: A new method for surface analysis

机译:牙科扫描电子显微镜的背向散射和二次电子图像:表面分析的新方法

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摘要

Objective: A scanning electron microscope (SEM) is a popular tool for investigating the root canal surface to visualize dentinal tubules, the smear layer and various root canal filling materials in endodontics. Most of the SEM micrographs taken in endodontic research are in secondary electrons (SE) mode, in which the topographic view of a subject can be demonstrated without giving any information about the real structure. Back-scattered electron (BSE) images are also used, which reveal some information about the internal structure while providing no topographic details. The aim of this study was to investigate the possibility of using back-scattered (BSE) and secondary electron (SE) modeofscanning electron microscopy (SEM) together for obtaining detailed information about biomaterials in relation to dental structures. Materials and methods: Mesiobuccal roots of four permanent maxillary molars were cleaned and shaped with rotary instruments. Two samples were obturated with guttapercha and sealer. After 2 weeks, gutta-perch was removed using rotary instruments and chloroform. In the other phase of the study, white mineral trioxide aggregate was mixed and packed into five glass tubes and exposed to blood, deionized water, synthetic tissue fluid and egg white. All the samples were prepared for visualization under SE and BSE modes of SEM to observe the characteristics of material remnants and surface structures. Results: BSE mode illustrated different grey scale views which made it possible to differentiate dentin chips from filling material remnants on the surface of root canal dentin. In addition, SE mode focusedonimage topography, while a BSE detector showed new texture formationonthe surface of white mineral trioxide aggregate exposed to proteinaceous fluids such as blood or egg white. Conclusions: Mapping BSE and SE micrographs helped ustobetter understand the structure of materials on the surface ofroot canal dentin and MTA. Moreover, analysis of structure of materials on the surface of root canal dentine and MTA can be performed better by mapping of BSE and SE micrographs.
机译:目的:扫描电子显微镜(SEM)是一种用于检查牙根管表面以可视化牙髓中牙本质小管,涂片层和各种牙根管填充材料的流行工具。牙髓学研究中拍摄的大多数SEM显微照片都是在二次电子(SE)模式下进行的,其中可以显示对象的地形图,而无需提供任何有关实际结构的信息。还使用了背向散射电子(BSE)图像,该图像揭示了有关内部结构的一些信息,同时没有提供地形细节。这项研究的目的是研究使用反向散射(BSE)和二次电子(SE)扫描电子显微镜(SEM)模式以获得与牙齿结构有关的生物材料的详细信息的可能性。材料和方法:清洁四个永久性上颌磨牙的近颊颊根,并用旋转器械定型。用guttapercha和封闭剂封闭两个样品。 2周后,使用旋转仪器和氯仿去除牙龈鲈。在研究的另一阶段,将白色三氧化二矿骨料混合并包装到五个玻璃管中,并暴露于血液,去离子水,合成组织液和蛋清中。准备所有样品以在SEM的SE和BSE模式下进行可视化,以观察材料残余物和表面结构的特征。结果:BSE模式显示了不同的灰度视图,这使得区分牙本质芯片与填充根管牙本质表面的材料残留物成为可能。此外,SE模式聚焦于图像形貌,而BSE检测器显示了白色三氧化二矿骨料表面暴露于诸如血液或蛋清之类的蛋白质流体时新的纹理形成。结论:绘制BSE和SE显微照片有助于更好地了解牙根管和MTA表面材料的结构。此外,通过绘制BSE和SE显微照片,可以更好地进行根管牙本质和MTA表面材料的结构分析。

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