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Rectifying resistance-switching behaviour of Ag/SBTO/STMO/-Si heterostructure films

机译:整流AG / SbTo / STMO / -SI异质结构薄膜的电阻切换行为

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The (SBTO/STMO) heterostructure films were prepared on substrates by sol-gel spin-coating technique, and the films had good crystallinity and uniform grain distribution. The heterostructure films with a structure of Ag/SBTO/STMO/ exhibited a bipolar, remarkable resistance-switching characteristic, and . More importantly, the heterostructure films showed rectifying characteristic in the low resistance state (LRS), and the rectification ratio can reach at . The dominant resistive-switching conduction mechanism of high resistance state (HRS) was Ohmic behaviour, and the LRS changed to space charge-limited current (SCLC).
机译:通过溶胶 - 凝胶旋涂技术在基材上制备(SbTo / STMO)异质结构膜,并且膜具有良好的结晶度和均匀的晶粒分布。 具有Ag / SbTo / STMO / STMO /结构的结构的异质结构膜表现出双极性,显着的电阻开关特性和。 更重要的是,异质结构膜在低电阻状态(LRS)中显示出整流特性,并且整流比可以达到。 高电阻状态(HRS)的主要电阻切换传导机构是欧姆行为,并且LRS改变为空间电荷限制电流(SCLC)。

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