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首页> 外文期刊>Journal of Electronic Materials >Thickness Dependence of Optoelectronic Properties of Molybdenum Diselenide-Based Nanodevices
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Thickness Dependence of Optoelectronic Properties of Molybdenum Diselenide-Based Nanodevices

机译:基于钼烯烃基纳米型纳米型纳米型纳米钼的光电性质的厚度依赖性

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摘要

Two-dimensional molybdenum diselenide (MoSe2) has application potential in optical and optoelectronic devices. In this study, we fabricated field-effect transistors based on two-dimensional MoSe2 flakes and investigated the effect of flake thickness on the optoelectronic properties of the devices. An increase in MoSe2 flake thickness caused an enhancement in the optoelectronic performance of the device under 532 nm laser illumination. The thickest MoSe2 flake-based device showed the highest photoresponsivity of approximately 753 A W-1, and the external quantum efficiency and specific detectivity of the device were 175.891%, and 2.8 x 10(11) cm Hz(1/2) W-1, respectively. The prepared two-dimensional MoSe2 flakes exhibited promising properties for nano-optoelectronic device applications.
机译:二维钼酶(MOSE2)具有光学和光电器件的应用势。 在这项研究中,我们基于二维MOSE2薄片制造了场效应晶体管,并研究了薄片厚度对器件光电性能的影响。 MOSE2薄片厚度的增加引起了532nm激光照明下的装置的光电性能的增强。 最厚的MOSE2剥落的装置显示出大约753A W-1的最高光响应性,并且该装置的外部量子效率和特定探测率为175.891%,2.8×10(11)cm Hz(1/2)W- 分别为1。 制备的二维MOSE2薄片表现出用于纳米光电器件应用的有希望的性能。

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