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Dependency of f states in fluorite-type XO2 (X = Ce, Th, U) on the stability and electronic state of doped transition metals

机译:F状态在萤石型XO2(X = CE,TH,U)上的依赖性对掺杂过渡金属的稳定性和电子状态

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摘要

Fluorite-type XO2 (X = Ce, Th, U) have versatile technological and industrial applications, and the behavior of impurities in the oxides is one of the engaging topics for their application. However, the fundamental behaviors of impurities are still lacking. Herein, we conduct a systematic first-principles DFT+U screening to find the trends of transition metal (TM) behaviors in the three dioxides in terms of energetics and electronic states, with a particular focus on the dependency of f electronic states of the hosts. In order to overcome the long-standing bottleneck of determining the true oxidation state of multivalent TMs, Ce and U, a more rigorous method based on counting orbital occupation numbers of f and d orbitals is performed for clarification. The calculated incorporation energies and formation energies of TMs show that the relative stability of TMs in the three XO2 exhibits similar trends, indicative of the dominant roles played by the host oxides with the same crystal structure and very close lattice parameters. On the other hand, the quantitative differences in the stability and electronic state of doped TMs could be mainly attributed to the differences in the electronic structure of host XO2. The 5f electrons in UO2 are more delocalized than 4f in CeO2, suppressing the formation of high oxidation states of TMs in the former. For ThO2 with the negligible f electrons associated with monovalent Th4+, the doped TMs tend to adopt the oxidation states close to TM4+, achieving the electronically matched states. The appearance of a few unusual oxidation states of TMs sheds light on the flexible delocalizationlocalization mutual transition of f or d valence electrons.
机译:萤石型XO2(X = CE,u)具有多功能的技术和工业应用,氧化物中的杂质的行为是其应用的接合主题之一。然而,杂质的基本行为仍然缺乏。在此,我们进行系统的第一原理DFT + U筛选,以在能量和电子国家方面找到三种二氧化碳中过渡金属(TM)行为的趋势,特别关注主机的电子国家的依赖性。为了克服确定多价TMS的真正氧化状态的长时间瓶颈,Ce和U,基于计数F和D轨道的计数轨道占用数的更严格的方法进行澄清。 TMS的计算掺入能量和形成能量表明,三XO2中TMS的相对稳定性表现出类似的趋势,指示宿主氧化物具有相同晶体结构和非常紧密的晶格参数的主导作用。另一方面,掺杂TMS的稳定性和电子状态的定量差异主要归因于主机XO2的电子结构的差异。 UO2中的5F电子比CEO2中的4F更划分,抑制了前者中TMS的高氧化态的形成。对于与单价Th4 +相关的可忽略不计的F电子来说,掺杂的TMS倾向于采用接近TM4 +的氧化状态,实现电子匹配状态。 TMS揭示荧光对F或D价电子的柔性截障曲线化相互转变的少数异常氧化状态的外观。

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    Sci &

    Technol Surface Phys &

    Chem Lab Mianyang 621908 Sichuan Peoples R China;

    Sci &

    Technol Surface Phys &

    Chem Lab Mianyang 621908 Sichuan Peoples R China;

    Sci &

    Technol Surface Phys &

    Chem Lab Mianyang 621908 Sichuan Peoples R China;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 物理学;化学;
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