Statistical analysis and equivalent modelling for the simulation of photoelectronic devices with microstructures

摘要

Equivalent models using scatter function and the statistical analysis with Hypothesis-test are provided to overcome the computational requirement for simulating complicated microstructures of photoelectronic devices. Strategies are introduced to explore the minimal number of rays and spectrum resolution to complete the analysis. Results indicate that on an average 1/25 reduction factor of computational time is possible, which is extremely helpful if an optimization procedure is required for microstructures.