...
首页> 外文期刊>RSC Advances >Modified top-down approach for synthesis of molybdenum oxide quantum dots: sonication induced chemical etching of thin films
【24h】

Modified top-down approach for synthesis of molybdenum oxide quantum dots: sonication induced chemical etching of thin films

机译:改进的自上而下方法,用于合成氧化钼量子点:超声诱导薄膜的化学蚀刻

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

A simple and modified top-down approach to synthesize molybdenum oxide (MoOx: x = 2, 3) quantum dots (QDs) is proposed in this study. This modified approach involves the conversion of a bulk powder material into thin films followed by a sonication induced chemical etching process for synthesising QDs. X-Ray Diffraction (XRD) is used for crystal structural characterization of MoOx thin films. The crystal structure properties of the MoOx QDs are analysed by High Resolution Transmission Electron Microscopy (HRTEM) images and corresponding Selected Area Electron Diffraction (SAED) patterns. The optical band gap is estimated by Tauc's plot from UV-Vis-NIR absorption spectra. The excitation dependent photoluminescence (PL) emission of MoOx QDs as a function of acid concentration is investigated. The growth mechanism of QDs in different crystalline phases as a function of acid concentration is also exemplified in this work. The micro-Raman and Fourier Transform of Infrared (FTIR) spectra are recorded to analyse the vibrational spectrum of the molybdenum-oxygen (Mo-O) bonds in the MoOx QDs.
机译:在本研究中提出了一种简单且改性的自上而下的方法来合成氧化钼(MOOX:X = 2,3)量子点(QDS)。这种改进的方法涉及将散装粉末材料转化为薄膜,然后是用于合成QD的超声诱导的化学蚀刻方法。 X射线衍射(XRD)用于MOOX薄膜的晶体结构表征。通过高分辨率透射电子显微镜(HRTEM)图像和相应的选择区域电子衍射(SAED)图案来分析MOOX QD的晶体结构性质。通过UV-Vis-Nir吸收光谱估计光带隙估计。研究了作为酸浓度的函数的MOOX QDS的激发依赖性光致发光(PL)发射。在该工作中也举例说明了作为酸浓度的函数的不同结晶相中QDS的生长机制。记录红外线(FTIR)光谱的微拉曼和傅里叶变换以分析MOOX QDS中钼 - 氧(MO-O)键的振动谱。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号