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Impact of the in situ rise in hydrogen partial pressure on graphene shape evolution during CVD growth of graphene

机译:石墨烯CVD生长过程中石墨形逸出氢分压对石墨烯形状的影响

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摘要

Exposing graphene to a hydrogen post-etching process yields dendritic graphene shapes. Here, we demonstrate that similar dendritic structures can be achieved at long growth times without adding hydrogen externally. These shapes are not a result of a surface diffusion controlled growth but of the competing backward reaction (etching), which dominates the growth dynamics at long times due to an in situ rise in the hydrogen partial pressure. We have performed a systematic study on the growth of graphene as a function of time to identify the onset and gradual evolution of graphene shapes caused by etching and then demonstrated that the etching can be stopped by reducing the flow of hydrogen from the feed. In addition, we have found that the etching rate due to the in situ rise in hydrogen is strongly dependent on the confinement (geometrical confinement) of copper foil. Highly etched graphene with dendritic shapes was observed in unconfined copper foil regions while no etching was found in graphene grown in a confined reaction region. This highlights the effect of the dynamic reactant distribution in activating the in situ etching process during growth, which needs to be counteracted or controlled for large scale growth.
机译:将石墨烯暴露于氢后蚀刻工艺产生树突石墨烯形状。在这里,我们证明可以在长生长时间内实现类似的树突结构,而不会在外部添加氢气。这些形状不是表面扩散控制的增长,而是竞争的后向反应(蚀刻),其由于氢分压中的原位升高而在长时间主导生长动态。我们对石墨烯的生长作为时间的函数进行了系统研究,以识别由蚀刻引起的石墨烯形状的起始和逐渐发展,然后证明可以通过减少来自进料的氢气流动来停止蚀刻。此外,我们发现氢气原位上升引起的蚀刻率强烈依赖于铜箔的约束(几何限制)。在无括的铜箔区域中观察到具有树突形状的高度蚀刻石墨烯,而在狭窄的反应区域中没有蚀刻在石墨烯中发现蚀刻。这突出了动态反应物分布在生长期间激活原位蚀刻过程的效果,这需要抵消或控制大规模生长。

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  • 来源
    《RSC Advances》 |2018年第15期|共6页
  • 作者单位

    CSIC BIST Catalan Inst Nanosci &

    Nanotechnol ICN2 Campus UAB Barcelona 08193 Spain;

    CSIC BIST Catalan Inst Nanosci &

    Nanotechnol ICN2 Campus UAB Barcelona 08193 Spain;

    CSIC BIST Catalan Inst Nanosci &

    Nanotechnol ICN2 Campus UAB Barcelona 08193 Spain;

    CSIC BIST Catalan Inst Nanosci &

    Nanotechnol ICN2 Campus UAB Barcelona 08193 Spain;

    CSIC BIST Catalan Inst Nanosci &

    Nanotechnol ICN2 Campus UAB Barcelona 08193 Spain;

    CSIC BIST Catalan Inst Nanosci &

    Nanotechnol ICN2 Campus UAB Barcelona 08193 Spain;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 化学;
  • 关键词

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