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Time Efficient Evaluation of Multi-axis MEMS Gyroscope Using Three-dimensional Test Methodology

机译:使用三维试验方法的多轴MEMS陀螺仪的时间高效评估

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摘要

Recently, the demand for micro-electromechanical systems (MEMS) based inertial sensors has been increased due to a wide range of application in consumer electronics; however, high volume production remains a major challenge for the MEMS industry. This paper proposes a new three dimensional (3-D) test methodology for the time-efficient evaluation of multi-axis MEMS gyroscopes. A mathematical model for the proposed 3-D test method was derived based on the coordinates transformation. The 3-D test methodology was validated experimentally using three-axis MEMS gyroscope from ST Microelectronics and the results were compared with the conventional one dimensional (1-D) test method. The experimental results revealed that the measurement error between the conventional 1-D and the proposed 3-D test was less than 1%, whereas the test time was decreased three times. Finally, the error sources and limitations of the proposed 3-D test method was highlighted.
机译:最近,由于消费电子产品的广泛应用,对微机电系统(MEMS)的惯性传感器的需求增加; 然而,高批量生产仍然是MEMS行业的主要挑战。 本文提出了一种新的三维(3-D)试验方法,用于多轴MEMS陀螺仪的时间效率评估。 基于坐标转换导出所提出的3-D测试方法的数学模型。 使用三轴MEMS陀螺从ST微电子实验验证3-D测试方法,并将结果与常规的一维(1-D)测试方法进行比较。 实验结果表明,常规1-D和所提出的3-D试验之间的测量误差小于1%,而测试时间减少了三次。 最后,突出显示了所提出的3-D测试方法的误差源和限制。

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