...
首页> 外文期刊>Nanotechnology >Suppression of axial growth by boron incorporation in GaAs nanowires grown by self-catalyzed molecular beam epitaxy
【24h】

Suppression of axial growth by boron incorporation in GaAs nanowires grown by self-catalyzed molecular beam epitaxy

机译:通过自催化分子束外延生长的GaAs纳米线的硼掺入抑制轴向生长

获取原文
获取原文并翻译 | 示例

摘要

The addition of boron to GaAs nanowires grown by self-catalyzed molecular beam epitaxy was found to have a strong effect on the nanowire morphology, with axial growth greatly reduced as the nominal boron concentration was increased. Transmission electron microscopy measurements show that the Ga catalyst droplet was unintentionally consumed during growth. Concurrent radial growth, a rough surface morphology and tapering of nanowires grown under boron flux suggest that this droplet consumption is due to reduced Ga adatom diffusion on the nanowire sidewalls in the presence of boron. Modelling of the nanowire growth puts the diffusion length of Ga adatoms under boron flux at around 700-1000 nm. Analyses of the nanowire surfaces show regions of high boron concentration, indicating the surfactant nature of boron in GaAs.
机译:发现通过自催化分子束外延生长的GaAs纳米线的硼加入对纳米线形态产生强烈影响,随着标称硼浓度增加,轴向生长大大减少。 透射电子显微镜测量结果表明,在生长期间无意地消耗GA催化剂液滴。 并发径向生长,在硼通量下生长的粗糙表面形态和逐渐变细的纳米线表明该液滴消耗是由于硼侧壁上的Ga Adatom扩散降低。 纳米线生长的建模将Ga Adatoms在硼通量下的扩散长度在700-1000nm左右。 纳米线表面的分析显示高硼浓度的区域,表明GaAs中硼的表面活性剂本质。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号