首页> 外文期刊>Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics >Study of N ions implantation induced quantum well intermixing in GaInP/AlGaInP quantum well structures
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Study of N ions implantation induced quantum well intermixing in GaInP/AlGaInP quantum well structures

机译:N离子注入引起GaInP / AlGaInP量子阱结构中量子阱混合的研究

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N ions implantation induced quantum well intermixing in GaInP/AlGaInP triple quantum-well laser structures was firstly reported in this work. N ions were implanted with the energy of 40 keV and dose of 1e17 ions/cm(2), and thereafter rapid thermal annealing process were performed at 750 degrees C from 40 s to 200 s to induce the intermixing. The photoluminescence wavelength blue-shifts were found increased with the increasing time and the largest blue-shift of 54.9 nm was obtained for 200 s annealing. Surface morphology results shows that the photoluminescence improvement in the annealing samples came from the restoration effect of the layer crystal and hetero-structure interfaces. X-ray photoelectron spectroscopy tests shows that the implanting N ions tend to form Ga-N bonding besides generating point defect to induce quantum well intermixing. (C) 2015 Elsevier B.V. All rights reserved.
机译:这项工作首次报道了N离子注入在GaInP / AlGaInP三重量子阱激光结构中引起的量子阱混合。 N离子注入的能量为40 keV,剂量为1e17离子/ cm(2),然后在750摄氏度下从40 s到200 s进行快速热退火过程,以诱导混合。发现光致发光波长蓝移随时间的增加而增加,并且在200 s的退火过程中,最大的蓝移为54.9 nm。表面形貌结果表明,退火样品的光致发光性能的提高来自于层状晶体和异质结构界面的恢复作用。 X射线光电子能谱测试表明,注入的N离子除产生点缺陷外还倾向于形成Ga-N键,从而引起量子阱混合。 (C)2015 Elsevier B.V.保留所有权利。

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