首页> 外文期刊>Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics >Complementary switching on TiN/MgZnO/ZnO/Pt bipolar memory devices for nanocrossbar arrays
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Complementary switching on TiN/MgZnO/ZnO/Pt bipolar memory devices for nanocrossbar arrays

机译:用于纳米交叉开关阵列的TiN / MgZnO / ZnO / Pt双极存储器件的互补开关

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摘要

We report the reproducible complementary switching based on the exceptional TiN/MgZnO/ZnO/Pt bipolar resistive memory devices. The uniform complementary switching with good endurance was observed after the second electroforming process. The resultant complementary switching of TiN/MgZnO/ZnO/Pt devices were interpreted in view of rupture and recovery of conductive filaments inside MgZnO layer and ZnO layer resulted from the redistribution of oxygen vacancies. The TiN/MgZnO/ZnO/Pt devices with complementary switching characteristics ensure the capability to suppress the sneak current paths of cross-point memories, and have great potential applications for future 3D crossbar memory architecture
机译:我们报告了基于出色的TiN / MgZnO / ZnO / Pt双极电阻存储器件的可再现互补开关。在第二次电铸过程后,观察到具有良好耐久性的均匀互补开关。鉴于氧空位的重新分布导致了MgZnO层和ZnO层内部的导电细丝的断裂和恢复,解释了TiN / MgZnO / ZnO / Pt器件产生的互补开关。具有互补开关特性的TiN / MgZnO / ZnO / Pt器件确保了抑制交叉点存储器的潜电流路径的能力,并且在未来的3D交叉开关存储器架构中具有巨大的潜在应用

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