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首页> 外文期刊>Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics >Annealing effects of co-doping with Al and Sb on structure and optical-electricalproperties of the ZnO thin films
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Annealing effects of co-doping with Al and Sb on structure and optical-electricalproperties of the ZnO thin films

机译:Al和Sb共掺杂对ZnO薄膜结构和光电性能的影响

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摘要

The ZnO thin films co-doped with Al and Sb have been successfully deposited by a sol-gel spin-coatingmethod on glass substrates and annealed at different temperature for 2 h in air. The annealing effectsof different temperature on the structure and biaxial stress were characterized by X-ray diffraction. Theresults revealed that the annealed ZnO thin films mainly consist of ZnO with wurtzite structure, and thebiaxial stress is lower during annealed at 550 °C. The annealed films have high transmittance in the visibleregion and show sharp absorption edges in the UV region. The optical band gap E_g values are 2.95,3.03,3.18 and 3.15 eV, which corresponding to the films annealed at 450, 500, 550, 600 °C, respectively. Theresistivity of thin films reaches a minimum when the annealing temperature at 550 °C. The conductingmechanism is contributed to Sb substitute for Zn inducing two corresponding Zn vacancies.
机译:通过溶胶-凝胶旋涂法成功地在玻璃基板上沉积了共掺杂有Al和Sb的ZnO薄膜,并在不同温度下于空气中退火2 h。通过X射线衍射表征了不同温度对结构和双轴应力的退火作用。结果表明,退火后的ZnO薄膜主要由纤锌矿结构的ZnO组成,在550℃下退火时双轴应力较低。退火后的薄膜在可见光区域具有高透射率,在紫外光区域显示出尖锐的吸收边缘。光学带隙E_g值为2.95、3.03、3.18和3.15eV,其分别对应于在450、500、550、600℃下退火的膜。当退火温度为550°C时,薄膜的电阻率达到最小值。导电机制有助于Sb替代Zn引起两个相应的Zn空位。

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