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首页> 外文期刊>Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics >Structural, magnetic and dielectric properties of Zr-Cd substituted strontium hexaferrite (SrFe_(12)O_(19)) nanoparticles
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Structural, magnetic and dielectric properties of Zr-Cd substituted strontium hexaferrite (SrFe_(12)O_(19)) nanoparticles

机译:Zr-Cd取代六锶锶铁氧体(SrFe_(12)O_(19))纳米粒子的结构,磁性和介电性能

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Strontium hexaferrite nanoparticles with nominal composition SrZr_xCd_xFe_(12-2x)O_(19) (for x =0.0-0.6) with step increment of 0.2 have been synthesized by the chemical co-precipitation technique. XRD, hysteresis loops measurements and LCR meter were employed to evaluate the structure, magnetic and dielectric properties of SrZr_xCd_xFe_(12-2x)O_(19) nanomaterials. The XRD analysis confirms the single phase and various parameters such as lattice constants (a and c), cell volume and crystallite size have also been calculated from the XRD data. The crystallite size is found in the range of 28-39 nm. The magnetic properties such as saturation magnetization, remanence and coercivity are calculated from the hysteresis loops. Values of saturation magnetization are found to increase up to the substitution level of x=0.0-0.2 while that of remanence and coercivity decrease continuously with increase in Zr-Cd concentration. The dielectric properties as a function of frequency under normal conditions were also measured in the frequency range of 500 Hz to 1 MHz. The dielectric constants and tangent of dielectric loss factor remained within the range of 3347-30 and 11-0.24, respectively. The decrease in coercivity while increase in saturation magnetization confirms that the synthesized materials are suitable for applications in high-density recording media.
机译:通过化学共沉淀技术合成了标称组成为SrZr_xCd_xFe_(12-2x)O_(19)(对于x = 0.0-0.6)的六价锶锶纳米粒子。利用XRD,磁滞回线测量和LCR仪评估了SrZr_xCd_xFe_(12-2x)O_(19)纳米材料的结构,磁性能和介电性能。 XRD分析证实了单相,还从XRD数据中计算出各种参数,例如晶格常数(a和c),晶胞体积和微晶尺寸。发现微晶尺寸在28-39nm的范围内。从磁滞回线计算出诸如饱和磁化强度,剩磁和矫顽力之类的磁性。发现饱和磁化强度的值增加到x = 0.0-0.2的取代水平,而剩磁和矫顽力的值随Zr-Cd浓度的增加而连续降低。在500 Hz至1 MHz的频率范围内,还测量了正常条件下介电性能随频率变化的情况。介电常数和介电损耗因数的正切分别保持在3347-30和11-0.24的范围内。矫顽力降低而饱和磁化强度提高证实了合成材料适用于高密度记录介质。

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