首页> 外文期刊>The journal of physical chemistry, C. Nanomaterials and interfaces >Computational Investigation of Coverage-Dependent Behavior on Functionalization of the Semiconductor X (100)-2 x 1 Surface (X = C, Si, and Ge) by Cycloaddition of Transition Metal Oxides
【24h】

Computational Investigation of Coverage-Dependent Behavior on Functionalization of the Semiconductor X (100)-2 x 1 Surface (X = C, Si, and Ge) by Cycloaddition of Transition Metal Oxides

机译:通过过渡金属氧化物的环加成反应,对半导体X(100)-2 x 1表面(X = C,Si和Ge)的功能化的覆盖依赖行为的计算研究。

获取原文
获取原文并翻译 | 示例
           

摘要

By means of density functional theory in conjunction with periodic slab models, coverage-dependent behavior for chemical functionalization of the semiconductor X (100) (X = C, Si, and Ge) surface by traditional cycloaddition of transition metal oxides (OsO4 and RuO4) has been investigated. We found that the transition-metal-mediated oxygen transfer reaction for cycloaddition of OsO4 and RuO4 onto X (100) is quite favorable. The adsorption energies decrease as the coverage is increased, and the band gap is widened or reduced depending on both the type of model molecules and the coverage. Furthermore, it is feasible to form organic layer films of transition metal oxides onto the semiconductor X (100) surface as reflected by the high adsorption energies at the saturated coverage, which could lead to new hybrid multifunctional materials. In addition, interestingly, two distinct and competitive monolayer structures are simultaneously observed on both the Si (100) and the Ge (100) surfaces, but only one stable monolayer geometry is found on the C (100) surface, indicating the flexibility of controlling the self-assembled molecular binding configuration using transition metal oxides on the semiconductor X (100) surface. It is hoped that our results may help to seek appropriate chemical modification methods to widen the application fields of the group IV semiconductor-based hybrid materials.
机译:借助密度泛函理论和周期性平板模型,通过传统的环加过渡金属氧化物(OsO4和RuO4)对半导体X(100)(X = C,Si和Ge)表面进行化学功能化的覆盖率依赖行为已被调查。我们发现,过渡金属介导的氧转移反应对于将OsO4和RuO4环加成到X(100)上是非常有利的。吸附能随着覆盖率的增加而降低,并且带隙根据模型分子的类型和覆盖率而增大或减小。此外,可行的是在半导体X(100)的表面上形成过渡金属氧化物的有机层膜,这是由饱和覆盖率下的高吸附能所反映的,这可能会导致新的混合多功能材料的出现。此外,有趣的是,在Si(100)和Ge(100)表面上同时观察到两个截然不同的竞争性单层结构,但在C(100)表面上仅发现一个稳定的单层几何结构,这表明控制的灵活性使用半导体X(100)表面上的过渡金属氧化物的自组装分子结合构型。希望我们的结果可能有助于寻求适当的化学修饰方法,以扩大基于IV族半导体的混合材料的应用领域。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号