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Comparison of density functionals for nitrogen impurities in ZnO

机译:ZnO中氮杂质的密度泛函比较

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摘要

Hybrid functionals and empirical correction schemes are compared to conventional semi-local density functional theory (DFT) calculations in order to assess the predictive power of these methods concerning the formation energy and the charge transfer level of impurities in the wide-gap semiconductor ZnO. While the generalized gradient approximation fails to describe the electronic structure of the N impurity in ZnO correctly, methods that widen the band gap of ZnO by introducing additional non-local potentials yield the formation energy and charge transfer level of the impurity in reasonable agreement with hybrid functional calculations. Summarizing the results obtained with different methods, we corroborate earlier findings that the formation of substitutional N impurities at the oxygen site in ZnO from N atoms is most likely slightly endothermic under oxygen-rich preparation conditions, and introduces a deep level more than 1 eV above the valence band edge of ZnO. Moreover, the comparison of methods elucidates subtle differences in the predicted electronic structure, e.g., concerning the orientation of unoccupied orbitals in the crystal field and the stability of the charged triplet state of the N impurity. Further experimental or theoretical analysis of these features could provide useful tests for validating the performance of DFT methods in their application to defects in wide-gap materials.
机译:将混合功能和经验校正方案与常规半局部密度泛函理论(DFT)计算进行了比较,以评估这些方法在宽禁带半导体ZnO中与形成能和杂质的电荷转移能级有关的预测能力。尽管广义梯度近似无法正确描述ZnO中N杂质的电子结构,但通过引入额外的非局部电势来加宽ZnO的带隙的方法可以与杂化剂合理地达成一致,从而形成杂质的形成能和电荷转移能级功能计算。总结使用不同方法获得的结果,我们证实了先前的发现,即在富氧制备条件下,由N原子在ZnO的氧位上形成取代N杂质极有可能是轻微吸热的,并引入高于1 eV的深能级ZnO的价带边缘。此外,方法的比较阐明了所预测的电子结构中的细微差异,例如,关于晶体场中未占据的轨道的取向以及N杂质的带电三重态的稳定性。这些特征的进一步实验或理论分析可以为验证DFT方法应用于宽间隙材料缺陷的性能提供有用的测试。

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