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Trapping-mediated chemisorption of disilane on Si(100)-2*1

机译:捕集介导的乙硅烷在Si(100)-2 * 1上的化学吸附

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Disilane adsorption probabilities have been measured on Si(l00)-2X I over a wide range of incident kinetic energies, incident angles. and surface temperatures using supersonic molecular beam techniques. The trapping-mediated chemisorption mechanism is shown to be the dominant adsorption pathway under the conditions investigated. The first step in such a mechanism, namely trapping into the physical adsorption well, has been studied directly via measurements at a surface temperature of 77 K. As expected. the trapping probability drops with increasing kinetic energy. but nearly 50% of incident molecules trap at I eV incident energy, indicating that trapping is quite efficient over a wide range of translational energies. Chemisorption probability values measured at higher surface temperatures are fit to a simple trapping-mediated chemisorption model that can be used to predict adsorption probabilities over a wide range of conditions. Measurements of the chemisorption probability at 500 K are independent of incident angle at kinetic energies of 0.75 eV and below. However, trapping probabilities measured at 77 K are shown to decrease with increasing angle of incidence at kinetic energies of 0.6 eV and above. This unusual effect is discussed in terms of molecular scattering during parallel momentum accommodation. In order to investigate the effect of surface hydrogen formed as a result of disilane decomposition, adsorption probabilities ~were measured as a function of monohydride coverage as well. On a monohydride-saturated surface the trapping probability is found to be lower than on a bare surface, most likely due to a decreased disilane physical adsorption binding energy compared to the bare surface. Also, the trapping probability varies linearly with hydrogen coverage between bare-surface and monohydride-saturated values. On the other hand, the hydrogen coverage dependence of the chemisorption probability is found to follow a simple second-order kinetic scheme based on chemisorption occurring at two vacant surface sites.
机译:已经在Si(100)-2X I的宽范围的入射动能,入射角上测量了乙硅烷的吸附概率。和超音速分子束技术的表面温度。在所研究的条件下,捕获介导的化学吸附机制被证明是主要的吸附途径。通过在77 K的表面温度下进行测量,直接研究了这种机理的第一步,即捕获到物理吸附孔中。诱捕概率随动能的增加而下降。但是近50%的入射分子以1 eV的入射能量捕获,这表明在很大的平移能范围内捕获都是相当有效的。在较高的表面温度下测得的化学吸附概率值适合于简单的捕集介导的化学吸附模型,该模型可用于预测各种条件下的吸附概率。在500 K时化学吸附概率的测量值与0.75 eV及以下动能下的入射角无关。但是,在动能为0.6 eV及以上时,在77 K下测得的俘获概率随入射角的增加而降低。在并行动量调节过程中,根据分子散射讨论了这种不寻常的影响。为了研究由于乙硅烷分解而形成的表面氢的影响,还测量了吸附概率与一氢化物覆盖率之间的函数关系。在单氢化物饱和的表面上,发现捕获的可能性比在裸露的表面上低,这很可能是由于与裸露的表面相比,乙硅烷物理吸附结合能降低。而且,捕集概率随裸表面和一氢化物饱和值之间的氢覆盖率线性变化。另一方面,发现基于化学吸附概率的氢覆盖率依赖性遵循基于在两个空的表面位点处发生的化学吸附的简单的二级动力学方案。

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