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Spectroscopy of the interaction between nitrogen and hydrogen in ZnSe epitaxial layers

机译:ZnSe外延层中氮与氢相互作用的光谱学

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We report on detailed optical-spectroscopy investigations of nitrogen-doped ZnSe epitaxial layers of various doping levels and N contents which have been exposed ex situ to a hydrogen/deuterium plasma. The influence of this treatment is studied through temperature-dependent photoluminescence and selective photoluminescence. The results are similar for all samples, irrespective of their doping properties. We show that the Ns, acceptor is strongly passivated and that the deep compensating-donor disappears after plasma exposure. In addition, the nature of the main shallow compensating-donor is changed by the HID treatment. The shallow donor in ZnSe:N which we have previously identified as a N-related defect is suppressed while the usual residual impurities of ZnSe are uncovered. Our results directly demonstrate that all compensating donors in ZnSe:N material are N-related defects, and that N may participate to nonradiative recombination centers at heavy doping. Finally, this helps selecting a few models for the deep compensating-donor and further support the implication of N interstitials in carrier compensation in ZnSe:N. [References: 42]
机译:我们报告了对各种掺杂水平和氮含量的氮掺杂ZnSe外延层进行的详细光谱研究,这些氮掺杂的ZnSe外延层已经非原位暴露于氢/氘等离子体中。通过取决于温度的光致发光和选择性光致发光来研究这种处理的影响。无论其掺杂性质如何,所有样品的结果均相似。我们表明,Ns,受体是强烈钝化的,并且深度补偿供体在血浆暴露后会消失。另外,通过HID处理改变了主要的浅补偿施主的性质。先前我们确定为N相关缺陷的ZnSe:N中浅的施主被抑制,而ZnSe的常见残留杂质未被发现。我们的结果直接表明,ZnSe:N材料中的所有补偿供体都是与N相关的缺陷,并且N可能在重掺杂时参与非辐射复合中心。最后,这有助于为深度补偿施主选择一些模型,并进一步支持N间隙在ZnSe:N载流子补偿中的含义。 [参考:42]

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