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METHOD OF GROWING HIGH QUALITY ZnSe EPITAXIAL LAYER ONTO NEW Si SUBSTRATE

机译:在新的Si衬底上生长高质量的ZnSe外延层的方法

摘要

PROBLEM TO BE SOLVED: To provide a method of growing a high-quality large-area ZnSe layer on a Si substrate.;SOLUTION: The method grows a GeSi1-X/Ge epitaxial layer on a Si substrate by the ultra-high vacuum chemical vapor deposition (UHVCVD) method to finally form a ZnSe thin film on a Ge buffer layer. This manufacturing process provides two concepts. The first concept employs a strained interface to stop the dislocation arising from the GeSi1-X/Ge epitaxial layer, thus terminating the dislocation from propagating upwards. This results in a very reduced dislocation density of the ZnSe layer to improve the surface roughness. The second concept prevents anti-phase domains from growing due to the growth of a polar material on a non-polar material using an off-cut corner Si substrate, this solving the problem of the diffusion between dissimilar atoms during growing a usual ZnSe layer on the Si substrate.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:解决的问题:提供一种在Si衬底上生长高质量大面积ZnSe层的方法;解决方案:该方法通过超高真空化学方法在Si衬底上生长GeSi1-X / Ge外延层气相沉积(UHVCVD)方法,最终在Ge缓冲层上形成ZnSe薄膜。该制造过程提供了两个概念。第一个概念采用应变界面来阻止由GeSi1-X / Ge外延层引起的位错,从而阻止位错向上传播。这导致ZnSe层的位错密度大大降低,从而改善了表面粗糙度。第二个概念可以防止由于使用切角Si衬底在非极性材料上生长极性材料而导致极性相区域的生长,从而解决了在普通ZnSe层上生长异质原子之间扩散的问题。 Si基板。;版权所有:(C)2006,JPO&NCIPI

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