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Analytic method to optimize aperture design in focal modulation microscopy

机译:聚焦调制显微镜中优化孔径设计的解析方法

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Focal modulation microscopy (FMM) has been demonstrated more effective than confocal microscopy for imaging of thick biological tissues. To improve its penetration depth further, we propose a simple analytical method to enlarge the modulation depth, the unique property of FMM directly linked to its signal-to-noise ratio. The modulation depth increases as the excitation intensity of the binary phase aperture status is pushed further away from the focal region of the detection optics, thereby creating a dark region in the focal volume, which we call maximally flat crater (MFC). By direct algebraic manipulation, MFCs are achieved for both scalar and vector diffraction optics. Numerical results show that the modulation depth from MFC is very close to the maximum values, with a small difference less than 3% for the same number of subapertures. Applications of bifocus produced by MFC apertures are also discussed.
机译:聚焦调制显微镜(FMM)已被证明比共聚焦显微镜对厚生物组织的成像更有效。为了进一步提高其穿透深度,我们提出了一种简单的分析方法来扩大调制深度,FMM的独特特性直接与其信噪比相关。随着二进制相位孔径状态的激发强度被推离检测光学器件的焦点区域,调制深度会增加,从而在焦点体积中形成一个暗区,我们称之为最大平坦的坑口(MFC)。通过直接代数运算,可实现标量和矢量衍射光学器件的MFC。数值结果表明,来自MFC的调制深度非常接近最大值,对于相同数量的子孔径,差异很小,小于3%。还讨论了由MFC孔产生的双焦点的应用。

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